Determination of burn‐in parameters and residual life for highly reliable products

Today, many products are designed and manufactured to function for a long period of time before they fail. Determining product reliability is a great challenge to manufacturers of highly reliable products with only a relatively short period of time available for internal life testing. In particular, it may be difficult to determine optimal burn‐in parameters and characterize the residual life distribution. A promising alternative is to use data on a quality characteristic (QC) whose degradation over time can be related to product failure. Typically, product failure corresponds to the first passage time of the degradation path beyond a critical value. If degradation paths can be modeled properly, one can predict failure time and determine the life distribution without actually observing failures. In this paper, we first use a Wiener process to describe the continuous degradation path of the quality characteristic of the product. A Wiener process allows nonconstant variance and nonzero correlation among data collected at different time points. We propose a decision rule for classifying a unit as normal or weak, and give an economic model for determining the optimal termination time and other parameters of a burn‐in test. Next, we propose a method for assessing the product's lifetime distribution of the passed units. The proposed methodologies are all based only on the product's initial observed degradation data. Finally, an example of an electronic product, namely contact image scanner (CIS), is used to illustrate the proposed procedure. © 2002 Wiley Periodicals, Inc. Naval Research Logistics, 2003     

Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model

Instead of measuring a Wiener degradation or performance process at predetermined time points to track degradation or performance of a product for estimating its lifetime, we propose to obtain the first‐passage times of the process over certain nonfailure thresholds. Based on only these intermediate data, we obtain the uniformly minimum variance unbiased estimator and uniformly most accurate confidence interval for the mean lifetime. For estimating the lifetime distribution function, we propose a modified maximum likelihood estimator and a new estimator and prove that, by increasing the sample size of the intermediate data, these estimators and the above‐mentioned estimator of the mean lifetime can achieve the same levels of accuracy as the estimators assuming one has failure times. Thus, our method of using only intermediate data is useful for highly reliable products when their failure times are difficult to obtain. Furthermore, we show that the proposed new estimator of the lifetime distribution function is more accurate than the standard and modified maximum likelihood estimators. We also obtain approximate confidence intervals for the lifetime distribution function and its percentiles. Finally, we use light‐emitting diodes as an example to illustrate our method and demonstrate how to validate the Wiener assumption during the testing. © 2008 Wiley Periodicals, Inc. Naval Research Logistics, 2008     

存在工作历程产品的加速寿命试验统计分析

加速寿命试验(ALT)可在较短时间内获得产品的寿命及可靠性信息.利用ALT对产品的剩余寿命进行评估时,常常将已工作过的产品进行抽样并投入试验,在这一类样本的ALT数据统计分析时如何处理初始工作时间,成为ALT应用中的一个重要问题.工程实际中评估此类样本的剩余寿命时常常忽略初始工作时间,将其视为"用后如新"或"无记忆性"产品.但此假设必须以产品寿命服从指数分布为前提,而大部分机电产品的寿命服从Weibull分布,因而该方法在应用时必然会产生较大误差.针对这一问题提出了一种新的基于时间折算的ALT数据统计分析方法,并利用Monte Carlo仿真对其估计特性进行对比研究,结果表明此方法能有效评估存在初始工作历程产品的剩余寿命,估计精度优于原方法.     

稳像式火控系统实车训练装置的研制

该训练装置可以在安装稳像式火控系统的坦克上完成射击基础练习的训练与考核.它以单片机为核心,在射击操作与实车相同的条件下,具有自动检靶,自动记录发射数、命中数,自动变换目标,自动报警,自动评定和显示成绩等功能.射手可独自在坦克内操作,自行开始练习,自我检查操作结果.     

松耦合设计在计算机脆弱性测评系统中的应用

运用松耦合设计思想,对计算机脆弱性测评系统中两个子系统的组成和实现进行了研究。提出多准则测评子系统的Web数据库实现和CVE测评子系统的多层MAS实现方法,并对其实现算法和技术要点进行了论述。     

液相色谱-质谱法测定2-氯乙烯胂酸

研究了用液相色谱-质谱两种电离技术测定路易氏剂1的降解产物2-氯乙烯胂酸,比较了在不同流动相中该化合物的响应情况,并且利用源内CID技术获得了丰富质谱碎片,对所鉴定的碎片进行了解释,用选择离子检测得到该化合物的检测限在APCI电离技术中为9ng,在ESI电离技术中为4ng．     

漏磁信号特征提取及检测研究

介绍了漏磁检测原理和用有限元法计算漏磁场的方法,漏磁场法向分量的峰-峰值随缺陷深度增加而增加,峰-峰值间隔随缺陷宽度增大而增大。在检测中,先去除漏磁信号的奇异值,然后用峰-峰值算法提取缺陷信号特征,根据信号的峰-峰值大小和信号梯度变化作为缺陷判别标准。     

一种面向故障的软件测试新方法

面向故障的软件测试方法是今后软件测试技术研究的主要内容.和传统的面向整个软件的测试方法相比,面向故障的测试方法对故障的检测针对性更强,特别是对传统测试方法难以检测的故障如存储器泄露故障、数组越界故障、空指针引用故障等的检测是非常有效的.从方法学上讲,面向故障的测试方法标志着一个测试理论的成熟,在测试方法学中具有里程碑的意义.面向故障测试方法有2个问题需要解决:①软件的故障模型,②面向该模型的自动测试方法,此文重点论述软件的故障模型问题.     

数据驱动自动化测试方法研究

介绍了一种数据驱动方法,用以实现自动化测试.通过对测试数据的产生及选取、控制数据调度的研究发现,不仅应用更灵活的数据驱动方法,对程序进行更深、更广的测试,而且无需编写脚本,只需填写测试表,即可完成全面的自动化测试.这样,即使非技术人员也能够开发测试数据,完成数据驱动自动化测试.     

元器件性能退化信息的系统性能可靠性评估

性能可靠性方法为解决现代工程实际中的高可靠、长寿命、小子样产品的可靠性建模分析提供了途径.目前的性能可靠性研究主要是针对元器件开展的,对系统性能可靠性进行研究时通常需要将其看作一个元器件,需要得到系统的性能退化数据,在某些情况下,得到系统的性能退化数据比较困难.实际上,由于元器件的性能退化导致系统性能的变化,因而可以利...